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3327031e2b
$ git log --oneline 06a70769fd0b2e1f2a3085ad50ab620282bd77b3..cff1042cceec3502269947e96cf7023451af22f3
cff1042cce Fix error reporting (false negatives) in SGID tests
1924d341c0 support: Pick group in support_capture_subprogram_self_sgid if UID == 0
Testing Results:
Before After Diff
PASS 5074 5082 +8
XPASS 4 4 0
FAIL 121 116 -5
XFAIL 16 16 0
UNSUPPORTED 157 154 -3
cff1042cce Fix error reporting (false negatives) in SGID tests
Improved SGID test handling by unifying error reporting and using secure temporary directories.
Replaced non-standard exit codes and fixed premature exits to avoid masking failures.
These changes reduced false negatives, increasing overall test pass rates
UNSUPPORTED tests changes
-UNSUPPORTED: stdlib/tst-secure-getenv
-UNSUPPORTED: elf/tst-env-setuid-static
-UNSUPPORTED: elf/tst-env-setuid-tunables
FAILed tests changes
-FAIL: malloc/tst-aligned-alloc-random-thread-cross-malloc-check
-FAIL: malloc/tst-aligned-alloc-random-thread-malloc-check
-FAIL: malloc/tst-dynarray
-FAIL: malloc/tst-dynarray-mem
-FAIL: resolv/tst-resolv-aliases
PASSed tests changes
+PASS: stdlib/tst-secure-getenv
+PASS: elf/tst-env-setuid-static
+PASS: elf/tst-env-setuid-tunables
+PASS: malloc/tst-aligned-alloc-random-thread-cross-malloc-check
+PASS: malloc/tst-aligned-alloc-random-thread-malloc-check
+PASS: malloc/tst-dynarray
+PASS: malloc/tst-dynarray-mem
+PASS: resolv/tst-resolv-aliases
(From OE-Core rev: c40b9c33061c4019ed7790ccb799bb3491998b3d)
Signed-off-by: Deepesh Varatharajan <Deepesh.Varatharajan@windriver.com>
Signed-off-by: Steve Sakoman <steve@sakoman.com>